During an X-ray fluoroscopy procedure, position and orientation of an invasive device are measured with RF fields.

Robert D. Darrow, Charles L. Dumoulin

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Patent Number: US 5265610 A

Filing Date: 1991-09-03

Publication Date: 1993-11-30

Status: Expired – Lifetime

Current Assignee: General Electric Co

Applicants: General Electric Co.

IPC/CPC Classifications: A61B5/06;;A61B6/12;;H05G1/2

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