Abstract

An automated system for determining artifacts in imaging device test images.

Inventors

Richard I. Hartley, A. Nadeem Ishaque, Aiman A. Abdel-Malek
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Patent Details

Patent Number: US 5361307 A

Filing Date: 1993-03-25

Publication Date: 1994-11-01

Status: Expired – Fee Related

Current Assignee: General Electric Co

Applicants: General Electric Co.

IPC/CPC Classifications: G06T7/00;;H04N17/00

Patent Attorney
Lawrence P. Zale

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